Have you seen this post entitled ‘Africa’s brightest students shine at Intel ISEF 2016‘ written dy Danny Linington from IT News, Africa? It is a report back on the Intel International Science and Engineering Fair (Intel ISEF 2016), which was held in the United States in Phoenix, Arizona last week. Approximately 1,700 high school students from over 75 countries attended. Among these individuals three students from South Africa were highlighted and we offer them congratulations.
The Intel International Science and Engineering Fair 2016 event was funded jointly by Intel and the Intel Foundation with additional awards and support from dozens of other corporate, academic, governmental and science-focused organizations. The 2016 programme can be seen here: https://goo.gl/Gtdgxe
What is the Intel International Science and Engineering Fair?
The Intel International Science and Engineering Fair (Intel ISEF) is the world’s largest international pre-college science competition which annually provides a forum for more than 1,700 high school students from over 70 countries, regions, and territories to showcase their independent research and compete for about $6 million in awards.
South African student wins an Award
In the IT News article above Brynn Cauldwell from St Stithians Boys College, Johannesburg is highlighted. Brynn won the United Technologies Corporation Award, which came with $3,000 USD in shares of UTC common stock.
A great interview video from Danny Lingington
Danny Linington interviewed some of the African students about their projects in this video. Three of the students are from South Africa. The studnets from Africa interviewed are (Brynn Cauldwell (South Africa), Matthew Awhanjinu (Nigeria), Gracia Adudu (Nigeria), Zainab Badru (Nigeria), Amber De Decker (South Africa), Aryan Mootheeram (South Africa), Vishal Vekaria (Kenya) and Ramya Yanamandra (Kenya).
Well done to the students concerned and their schools for providing the opportunities. Thanks also to IT News for covering the event and reporting back on it.
